Multi-parameter CT for high-contrast material differentiation
This technology improves X-ray CT imaging by capturing two separate datasets using different detector configurations — one that emphasizes conventional X-ray transmission signals and one that also captures 'dark-field' signals (caused by small-angle scattering from fine structures). A computer then mathematically combines the two datasets to isolate the dark-field component, producing images with significantly higher contrast than either dataset alone. The result is sharper, more detailed imaging that can reveal subtle differences in tissue, materials, or objects that standard CT would miss. Applications span medical diagnostics, airport security screening, and industrial inspection.
What you could build
An enhanced CT scanner add-on or integrated system for medical imaging centers or industrial NDT providers that delivers higher-contrast images without requiring new radiation sources — sold to radiology equipment OEMs or industrial inspection system integrators.
Who in Virginia should care
Defense contractors and federal agencies in Northern Virginia (e.g., DHS, TSA technology programs) interested in improved security screening imaging, as well as Virginia hospital systems and medical device integrators.
Readiness: Lab validated
Concept — described but not yet demonstrated. Lab validated — supported by experimental results in the patent. Prototype likely — the text describes a built, working embodiment.
Readiness is inferred from the patent text, not from a lab visit.
The record
- Inventors
- Ge WANG, Wenxiang Cong
- Granted
- February 21, 2012
- Status
- Granted patent
- Patent number
- 8121249
Ready to talk?
Virginia Tech Intellectual Properties handles licensing for this technology.
Prosim summaries are generated from public patent text and are not legal advice.